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PELCO® Bar Clamp Vise, 4", 6" and 8" Dumont Innovative experimental nanotech TEM supports

SKU: 12931496624

4.1
USD379.98 USD403.98

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Ships within 48 hours · Estimated delivery Aug 11 - Aug 16

Description

Innovative experimental nanotech TEM supports

25/15/10 grids/vial for ultra fine mesh Pitch: Is 1"/mesh or 25

Not suitable with solvents

Stainless steel 1/16" pins (6 pins are included) can be placed on the clamps for awkwardly shaped samples

PELCO® Bar Clamp Vise, 4", 6" and 8" Dumont Innovative experimental nanotech TEM supportsDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
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